Advanced microwave test and measurements
SensorMetrix has extensive expertise and capabilities in performing RF/microwave characterization. In particular, SensorMetrix maintains measurement capabilities for a variety of composite materials and systems with diverse platforms and form factors. The team possesses two vector network analyzers (VNA), which covers a broad frequency ranges up to 40GHz. This can be coupled with highly reconfigurable and automated 2D/3D scanning systems provides rapid characterization on the scattering properties of RF/microwave materials and components.
SensorMetrix has developed advanced capabilities in radar cross section (RCS) measurement at various frequency bands of interest. Both monostatic and bistatic RCS of a target can be characterized by reconfiguration of horn antennas. SensorMetrix has developed a rotational mount system with low RCS signature, which allows for measurement of a target at various aspect angles. Moreover, SensorMetrix has developed measurement capability both inside a laboratory and in the field for different target platforms.
To enhance the RCS measurement and processing capability, SensorMetrix has developed a time domain analysis tool for evaluating measured frequency domain data. It can provide the response of a scattering target to an RF burst with an impulse shaped envelope. This tool provides a unique way to accurately determine the range of the scattering object by evaluating the S parameters in time domain. The utilization of time gating can improve the signal to noise ratio (SNR) of the measured data by selectively removing part of the responses in time domain.
SensorMetrix has developed Fabry-Perot type open resonant structures, configurable in either semi-confocal or confocal arrangements for metamaterials characterization in the 8 - 18 GHz range. These high Q resonators provide high sensitivity to enable measurement of electromagnetic losses. While multiple modes are present in the resonator, the fundamental TEM00 modes which have the smallest radial diameter are typically used. Extremely sensitive measurements of permittivity in dielectrics and surface resistance in metals can be made.
In addition to free space measurement, SensorMetrix has extensive experience and unique capability of conducting measurement in confined, waveguiding structures. SensorMetrix has multiple scannable parallel plate waveguide systems, which can be used to acquire both near-field distributions through 2D mapping and far-field radiation patterns by a transformation technique. A parallel plate waveguide measurement system at SensorMetrix contains a fixed top plate and a bottom plate on a motorized stage. The device under test placed on the bottom plate moves together with the plate. A pair of transmitting and receiving antennas connected to a VNA are placed in the plates for measuring 2D near fields. Both magnitude and phase of fields at the device are obtained over a frequency band of interest. SensorMetrix has further developed a near-field to far-field transformation method to characterize the cylindrical radiation patterns of the device.